By C. Monzio Compagnoni, A. Goda, A. S. Spinelli, P. Feeley, A. L. Lacaita, and A. Visconti
This paper reviews historical trends of nand Flash technologies, explaining why scaling of planar arrays below 1x nm is less favorable than vertical integration.
By Y. Cai, S. Ghose, E. F. Haratsch, Y. Luo, and O. Mutlu
This paper reviews the most recent advances in solid-state drive (SSD) error characterization, mitigation, and data recovery techniques to improve both SSD’s reliability and lifetime.
By N. R. Mielke, R. E. Frickey, I. Kalastirsky, M. Quan, D. Ustinov, and V. J. Vasudevan
This paper reviews SSD’s reliability from the perspective of failure mechanisms and design mitigation techniques, with particular emphasis on the JEDEC qualification methods.
This paper presents the advantages of hybrid SSDs integrating both storage class memories and nand Flash memories with respect to standard nand-Flash-based SSDs