This article reviews robustness in pattern recognition from the perspective of breaking three basic and implicit assumptions, which form the foundation of most pattern recognition models.
By J. Kibiłda, A. B. MacKenzie, M. J. Abdel-Rahman, S. K. Yoo, L. Galati Giordano, S. L. Cotton, N. Marchetti, W. Saad, W. G. Scanlon, A. Garcia-Rodriguez, D. López.-Pérez, H. Claussen, and L. A. DaSilva
This article brings together multiple strands of research to provide a comprehensive and integrated framework for the design and performance evaluation of indoor mmWave systems.